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Digital System Testing and Testable Design

By: Abramovici, Miron .ed.
Contributor(s): Breuer,Melvin A.ed | Friedman,Arthur D.ed.
Publisher: New Delhi Jaico 2001Description: xviii,652p.ISBN: 8172248911; 9788172248918.Subject(s): ELECTRONICSDDC classification: 621.381029
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Breuer,Melvin A.ed. | Friedman,Arthur D.ed.

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